Hazard assessment and control technology in semiconductor manufacturing : Symposium : Oct 1987, Cincinnati, OH.

• Material Type: 図書
• ISBN: 0873711327
• Title: Hazard assessment and control technology in semiconductor manufacturing : Symposium : Oct 1987, Cincinnati, OH.
• Author Heading: American Conference of Governmental Industrial Hygienists.; Semiconductor Industry Association.; National Institute for Occupational Safety and Health.
• Extent: v.
• Alternative Title: (Industrial Hygiene Science Series); hazard assessment ; control technology ; semiconductor manufacturing ; semiconductor industry ; NIOSH ; ACGIH
• NDLC: M17; NA
• Note (General): Papers.; (Industrial Hygiene Science Series); Index term: hazard assessment ; control technology ; semiconductor manufacturing ; semiconductor industry ; NIOSH ; ACGIH.; BL shelfmark: 89/11848 Hazard.
• Holding library: 国立国会図書館
• Call No.: M17-91-0104
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000003480849; http://id.ndl.go.jp/bib/000003480849
• UKMARC No.: G01185013
• Bibliographic Record Category (NDL): 215