Automatic testing in the next decade and in the 21st century International automatic testing conference : Sep 1989, Philadelphia, PA.

• Material Type: 図書
• Title: Automatic testing in the next decade and in the 21st century International automatic testing conference : Sep 1989, Philadelphia, PA.
• Author Heading: The Institute of Electrical and Electronics Engineers.; Instrumentation and Measurement Society.; Aerospace and Electronics Systems Society.
• Publication, Distribution, etc.: IEEE
• Publication Date: 1989.
• Publication Date (W3CDTF): 1989
• Extent: v.
• Alternative Title: Also known as Autotestcon '89 - Systems readiness technology conference. IEEE cat no 89CM2568-4. Held on fiche.; systems readiness technology ; autotestcon ; automatic testing ; IEEE
• Note (Material Type): [microform]
• NDLC: M17; M131
• Note (General): Papers.; Also known as Autotestcon '89 - Systems readiness technology conference. IEEE cat no 89CM2568-4. Held on fiche.; Index term: systems readiness technology ; autotestcon ; automatic testing ; IEEE.; BL shelfmark: 1835.425 1989.
• Holding library: 国立国会図書館
• Call No.: M17-90-2266-LS
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000003481357; http://id.ndl.go.jp/bib/000003481357
• UKMARC No.: G01301198
• Bibliographic Record Category (NDL): 215