Meeting the tests of time 20th International test conference : Aug 1989, Washington, DC.

Author: Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.

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Note (General)：: Papers.IEEE cat no 89CM2742-5. Also known as ITC. Held on fiche.Index term: test ; IEEE ; ITC....

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Material Type: 図書
ISBN: 0818689625 (case)
0818659629 (microfiche)
Title: Meeting the tests of time 20th International test conference : Aug 1989, Washington, DC.
Author Heading: Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.
Publication, Distribution, etc.: IEEE
Publication Date: 1989.
Publication Date (W3CDTF): 1989
Extent: v.
Alternative Title: IEEE cat no 89CM2742-5. Also known as ITC. Held on fiche
test ; IEEE ; ITC
Note (Material Type): [microform]
NDLC: M17
M154
Note (General): Papers.
IEEE cat no 89CM2742-5. Also known as ITC. Held on fiche.
Index term: test ; IEEE ; ITC.
BL shelfmark: 4550.438 1989.
Holding library: 国立国会図書館
Call No.: M17-90-2538-LS
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003481369
http://id.ndl.go.jp/bib/000003481369
UKMARC No.: G01291644
Bibliographic Record Category (NDL): 215