Defect control in semiconductors : International conference on the science and technology of defect control in semiconductors : Sep 1989, Yokohama, Japan.

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Note (General)：: Papers.In 2 vols. Also known as IC-STDCS. Held as The Yokohama 21st century forum 1989 to commemorate the centenary of Yokohama City.Index term: semic...

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Material Type: 図書
ISBN: 0444884297
Title: Defect control in semiconductors : International conference on the science and technology of defect control in semiconductors : Sep 1989, Yokohama, Japan.
Author Heading: Japan Society of Applied Physics.
Science and Technology Agency of Japan.
Publication, Distribution, etc.: North-Holland
Publication Date: 1990.
Publication Date (W3CDTF): 1990
Extent: v.
Alternative Title: In 2 vols. Also known as IC-STDCS. Held as The Yokohama 21st century forum 1989 to commemorate the centenary of Yokohama City
semiconductors ; defect control ; IC STDCS ; JSAP
NDLC: M17
ND
Note (General): Papers.
In 2 vols. Also known as IC-STDCS. Held as The Yokohama 21st century forum 1989 to commemorate the centenary of Yokohama City.
Index term: semiconductors ; defect control ; IC STDCS ; JSAP.
BL shelfmark: q90/27214 Defect.
Holding library: 国立国会図書館
Call No.: M17-91-0871
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003482160
http://id.ndl.go.jp/bib/000003482160
UKMARC No.: G01534437
Bibliographic Record Category (NDL): 215