Techniques for testing and measuring digital systems : Colloquium : Oct 1988, London, UK. (Colloquium Digest - IEE ; 1988-105)

Techniques for testing and measuring digital systems : Colloquium : Oct 1988, London, UK.

(Colloquium Digest - IEE ; 1988-105)

Author: Institution of Electrical Engineers. Electronics Division. Professional Group E1 (Measurements and Instruments in Electronics)ほか

Notes on use

Note (General)：: Papers and programme.Index term: IEE ; measuring digital systems ; testing digital systems.BL shelfmark: 3315.470 105 1988.

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Material Type: 図書
Title: Techniques for testing and measuring digital systems : Colloquium : Oct 1988, London, UK.
Series Title: Colloquium Digest - IEE ; 1988-105
Author Heading: Institution of Electrical Engineers. Electronics Division. Professional Group E1 (Measurements and Instruments in Electronics)
Institution of Electrical Engineers. Computing and Control Division. Professional Group C2 (Hardware and Systems Engineering)
Publication, Distribution, etc.: IEE
Publication Date: 1988.
Publication Date (W3CDTF): 1988
Extent: v.
Alternative Title: IEE ; measuring digital systems ; testing digital systems
NDLC: M17
ND
Note (General): Papers and programme.
Index term: IEE ; measuring digital systems ; testing digital systems.
BL shelfmark: 3315.470 105 1988.
Holding library: 国立国会図書館
Call No.: M17-91-2516
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003483835
http://id.ndl.go.jp/bib/000003483835
UKMARC No.: G01137100
Bibliographic Record Category (NDL): 215