Get ready for the next decade of test : ATE and instrumentation conference west : Jan 1990, Anaheim, CA.

• Material Type: 図書
• ISBN: 0879301779
• Title: Get ready for the next decade of test : ATE and instrumentation conference west : Jan 1990, Anaheim, CA.
• Author Heading: American Society of Test Engineers.; Electronics Test Magazine.; Circuits Manufacturing Magazine.; EOS/ESD Technology Magazines.
• Publication, Distribution, etc.: Boston, MA : Miller Freeman Expositions, a member of the United Newspapers Group
• Publication Date: 1990.
• Publication Date (W3CDTF): 1990
• Extent: v.
• Alternative Title: test ; ATE ; instrumentation ; test engineers
• NDLC: M17; M191
• Note (General): Papers.; Index term: test ; ATE ; instrumentation ; test engineers.; BL shelfmark: 8796.32742 1990.
• Holding library: 国立国会図書館
• Call No.: M17-92-0990
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000003485623; http://id.ndl.go.jp/bib/000003485623
• UKMARC No.: G01324205
• Bibliographic Record Category (NDL): 215