Test Solutions : Test Engineering Conference : Jun 1990, Boston, MA.

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Note (General)：: Papers.Conference theme: The showcase for test, instrumentation and measurement of electronics.Index term: test solutions ; test engineering ; instrum...

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Material Type: 図書
ISBN: 0879301779
Title: Test Solutions : Test Engineering Conference : Jun 1990, Boston, MA.
Author Heading: Electronics Test Magazine.
American Society of Test Engineers.
Extent: v.
Alternative Title: Conference theme: The showcase for test, instrumentation and measurement of electronics
test solutions ; test engineering ; instrumentation ; test engineers ; electronics
NDLC: M17
M191
Note (General): Papers.
Conference theme: The showcase for test, instrumentation and measurement of electronics.
Index term: test solutions ; test engineering ; instrumentation ; test engineers ; electronics.
Holding library: 国立国会図書館
Call No.: M17-92-0991
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003485624
http://id.ndl.go.jp/bib/000003485624
Bibliographic Record Category (NDL): 215