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Interferometry : Surface characterization and testing : Conference : Jul 1992, San Diego, CA. (SPIE Proceedings ; 1776)

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Interferometry : Surface characterization and testing : Conference : Jul 1992, San Diego, CA.

(SPIE Proceedings ; 1776)

Call No. (NDL)
M17-93-0832
Bibliographic ID of National Diet Library
000003489147
Material type
図書
Author
SPIE-The International Society for Optical Engineering.
Publisher
SPIE
Publication date
1992.
Material Format
Paper
Capacity, size, etc.
v.
NDC
-
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Notes on use

Note (General):

Papers.Index term: SPIE ; interferometry.BL shelfmark: 6823.100 vol 1776 1992.

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Paper

Material Type
図書
ISBN
0819409499 (pbk)
Publication, Distribution, etc.
Publication Date
1992.
Publication Date (W3CDTF)
1992
Extent
v.
Alternative Title
SPIE ; interferometry