VLSI test : 10th Anniversary symposium : Apr 1992, Atlantic City, NJ.

Author: Institute of Electrical and Electronics Engineers. Computer Society. Test Technology and Technical Committee.ほか

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Note (General)：: Papers.Conference theme: Design, test and application: ASICs and systems-on-a-chip. IEEE cat no 92TH04374.Index term: ASICS ; IEEE ; VLSI test....

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Material Type: 図書
ISBN: 0780306236 (pbk)
0780306244 (microfiche)
Title: VLSI test : 10th Anniversary symposium : Apr 1992, Atlantic City, NJ.
Author Heading: Institute of Electrical and Electronics Engineers. Computer Society. Test Technology and Technical Committee.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publication, Distribution, etc.: IEEE
Publication Date: 1992.
Publication Date (W3CDTF): 1992
Extent: v.
Alternative Title: Conference theme: Design, test and application: ASICs and systems-on-a-chip. IEEE cat no 92TH04374
ASICS ; IEEE ; VLSI test
NDLC: M17
M151
Note (General): Papers.
Conference theme: Design, test and application: ASICs and systems-on-a-chip. IEEE cat no 92TH04374.
Index term: ASICS ; IEEE ; VLSI test.
BL shelfmark: 4363.2365 10th 1992.
Holding library: 国立国会図書館
Call No.: M17-94-0785
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003493788
http://id.ndl.go.jp/bib/000003493788
UKMARC No.: G01979916
Bibliographic Record Category (NDL): 215