Defects in semiconductors 16 : 16th International conference : Jul 1991, Bethlehem, PA. (Materials Science Forum ; 83,84,85,86,87)

Defects in semiconductors 16 : 16th International conference : Jul 1991, Bethlehem, PA.

(Materials Science Forum ; 83,84,85,86,87)

Notes on use

Note (General)：: Papers.In 3 parts. Also known as ICDS 16.Index term: semiconductors ; defects ; ICDS....

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Material Type: 図書
ISBN: 0878496289
ISSN: 0255-5476
Title: Defects in semiconductors 16 : 16th International conference : Jul 1991, Bethlehem, PA.
Series Title: Materials Science Forum ; 83,84,85,86,87
Publication, Distribution, etc.: Trans Tech Publications
Publication Date: 1992.
Publication Date (W3CDTF): 1992
Extent: v.
Alternative Title: In 3 parts. Also known as ICDS 16
semiconductors ; defects ; ICDS
NDLC: M17
MC
Note (General): Papers.
In 3 parts. Also known as ICDS 16.
Index term: semiconductors ; defects ; ICDS.
BL shelfmark: 5396.4357 vol 83-87 pts 1-3 1992.
Holding library: 国立国会図書館
Call No.: M17-94-1452
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003494447
http://id.ndl.go.jp/bib/000003494447
UKMARC No.: G01808126
Bibliographic Record Category (NDL): 215