25th International test conference Oct 1994, Washington, DC.

Author: Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.ほか

Notes on use

Note (General)：: Papers.Also known as ITC 94. Theme title: Test: the next twenty-five years. Held on fiche. IEEE cat no 94CM3483-5.Index term: ITC ; test ; IEEE....

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Material Type: 図書
ISBN: 0780321022 (soft)
0780321030 (case)
0780321049 (microfiche)
Title: 25th International test conference Oct 1994, Washington, DC.
Author Heading: Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publication, Distribution, etc.: IEEE
Publication Date: 1994.
Publication Date (W3CDTF): 1994
Extent: v.
Alternative Title: Also known as ITC 94. Theme title: Test: the next twenty-five years. Held on fiche. IEEE cat no 94CM3483-5
ITC ; test ; IEEE
Note (Material Type): [microform]
NDLC: M17
M154
Note (General): Papers.
Also known as ITC 94. Theme title: Test: the next twenty-five years. Held on fiche. IEEE cat no 94CM3483-5.
Index term: ITC ; test ; IEEE.
BL shelfmark: 4550.438 1994.
Holding library: 国立国会図書館
Call No.: M17-95-1333-LS
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003499588
http://id.ndl.go.jp/bib/000003499588
UKMARC No.: G02427833
Bibliographic Record Category (NDL): 215