Defects in semiconductors 18 : 18th International Conference : Jul 1995, Sendai, Japan. (Materials Science Forum ; 196,197,198,199,200,201)

Defects in semiconductors 18 : 18th International Conference : Jul 1995, Sendai, Japan.

(Materials Science Forum ; 196,197,198,199,200,201)

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Note (General)：: Papers.In 4 parts. Also known as ICDS-18.Index term: semiconductors ; ICDS ; defects....

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Material Type: 図書
ISBN: 0878497129 (pt1 : pbk)
0878497137 (pt2 : pbk)
0878497145 (pt3 : pbk)
0878497153 (pt4 : pbk)
ISBN (set): 0878497161 (set : pbk)
ISSN: 0255-5476
Title: Defects in semiconductors 18 : 18th International Conference : Jul 1995, Sendai, Japan.
Series Title: Materials Science Forum ; 196,197,198,199,200,201
Author Heading: Ministry of Education, Science and Culture of Japan.
Publication, Distribution, etc.: Trans Tech Publications
Publication Date: 1995.
Publication Date (W3CDTF): 1995
Extent: v.
Alternative Title: In 4 parts. Also known as ICDS-18
semiconductors ; ICDS ; defects
NDLC: M17
MC
Note (General): Papers.
In 4 parts. Also known as ICDS-18.
Index term: semiconductors ; ICDS ; defects.
BL shelfmark: 5396.4357 vol 196-201 pts 1-4 1995.
Holding library: 国立国会図書館
Call No.: M17-96-0973
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003500377
http://id.ndl.go.jp/bib/000003500377
UKMARC No.: G02620170
Bibliographic Record Category (NDL): 215