5th Asian test symposium : Nov 1996, Hsinchu, Taiwan.

Author: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology. Asia Subcommittee.ほか

Notes on use

Note (General)：: Papers.Also known as ATS '96. IEEE cat no 96TB100072.Index term: test ; ATS ; IEEE.

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Material Type: 図書
ISBN: 0818674784 (pbk)
0818674792
0818674806 (microfiche)
ISSN: 1085-7735
Title: 5th Asian test symposium : Nov 1996, Hsinchu, Taiwan.
Author Heading: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology. Asia Subcommittee.
National Tsing Hua University.
Extent: v.
Alternative Title: Also known as ATS '96. IEEE cat no 96TB100072
test ; ATS ; IEEE
NDLC: M17
ND
Note (General): Papers.
Also known as ATS '96. IEEE cat no 96TB100072.
Index term: test ; ATS ; IEEE.
Holding library: 国立国会図書館
Call No.: M17-97-1458
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003503702
http://id.ndl.go.jp/bib/000003503702
Bibliographic Record Category (NDL): 215