EMC testing for conducted mechanisms : Colloquium : May 1996, London, UK. (Colloquium Digest - IEE ; 1996-116)

EMC testing for conducted mechanisms : Colloquium : May 1996, London, UK.

(Colloquium Digest - IEE ; 1996-116)

Author: Institution of Electrical Engineers. Electronics Division. Professional Group E2 (Electromagnetic Compatibility)

Notes on use

Note (General)：: Selected papers and programme.Index term: IEE ; EMC testing ; conducted mechanisms.BL shelfmark: 3315.470 [no] 116 1996.

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Material Type: 図書
ISSN: 0963-3308
Title: EMC testing for conducted mechanisms : Colloquium : May 1996, London, UK.
Series Title: Colloquium Digest - IEE ; 1996-116
Author Heading: Institution of Electrical Engineers. Electronics Division. Professional Group E2 (Electromagnetic Compatibility)
Publication, Distribution, etc.: IEE
Publication Date: 1996.
Publication Date (W3CDTF): 1996
Extent: v.
Alternative Title: IEE ; EMC testing ; conducted mechanisms
NDLC: M17
M191
Note (General): Selected papers and programme.
Index term: IEE ; EMC testing ; conducted mechanisms.
BL shelfmark: 3315.470 [no] 116 1996.
Holding library: 国立国会図書館
Call No.: M17-97-1865
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003504187
http://id.ndl.go.jp/bib/000003504187
UKMARC No.: G05156568
Bibliographic Record Category (NDL): 215