図書

VLSI test : 13th Symposium : Apr 1995, Princeton, NJ.

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VLSI test : 13th Symposium : Apr 1995, Princeton, NJ.

Call No. (NDL)
M17-97-2046
Bibliographic ID of National Diet Library
000003504326
Material type
図書
Author
Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology.ほか
Publisher
IEEE Computer Society Press
Publication date
1995.
Material Format
Paper
Capacity, size, etc.
v.
NDC
-
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Notes on use

Note (General)：

Papers.Also known as VTS '95. Theme: Test automation: reducing time to market. IEEE cat no 95TH8068.Index term: IEEE ; VLSI test ; VTS ; test automati...

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Paper

Material Type
図書
ISBN
0818670002 (pbk)
Title
VLSI test : 13th Symposium : Apr 1995, Princeton, NJ.
Author Heading
Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publication, Distribution, etc.
Los Alamitos, CA : IEEE Computer Society Press
Publication Date
1995.
Publication Date (W3CDTF)
1995
Extent
v.
Alternative Title
Also known as VTS '95. Theme: Test automation: reducing time to market. IEEE cat no 95TH8068
IEEE ; VLSI test ; VTS ; test automation
NDLC
M17
ND