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図書

AUTOTESTCON '96 32nd Annual conference : Sep 1996, Dayton, OH.

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AUTOTESTCON '96 32nd Annual conference : Sep 1996, Dayton, OH.

Call No. (NDL)
M17-97-0957-LS
Bibliographic ID of National Diet Library
000003505208
Material type
図書
Author
Institute of Electrical and Electronics Engineers. Aerospace and Electronic Systems Society.ほか
Publisher
IEEE
Publication date
1996.
Material Format
Microform
Capacity, size, etc.
v.
NDC
-
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Notes on use

Note (General)：

Papers.Also known as The system readiness technology conference. Theme: Test technology and commercialization. Held on fiche. IEEE cat no 96CM35955.In...

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Microform

Material Type
図書
ISBN
0780333802 (case)
0780333799 (soft)
0780333810 (microfiche)
ISSN
1088-7725
Title
AUTOTESTCON '96 32nd Annual conference : Sep 1996, Dayton, OH.
Author Heading
Institute of Electrical and Electronics Engineers. Aerospace and Electronic Systems Society.
Institute of Electrical and Electronics Engineers. Instrumentation and Measurement Society.
Publication, Distribution, etc.
IEEE
Publication Date
1996.
Publication Date (W3CDTF)
1996
Extent
v.
Alternative Title
Also known as The system readiness technology conference. Theme: Test technology and commercialization. Held on fiche. IEEE cat no 96CM35955
AUTOTESTCON ; IEEE ; test technology ; system readiness technology