Semiconductor thermal measurement and management 13th Annual symposium : Jan 1997, Austin, TX.

Author: Institute of Electrical and Electronics Engineers. Components, Packaging, & Manufacturing Technology Society (CPMT)

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Note (General)：: Papers.Also known as SEMITHERM or SEMI-THERM. Held on fiche. IEEE cat no 97CM36031.Index term: semiconductor thermal measurement ; IEEE ; SEMI THERM ;...

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Material Type: 図書
ISBN: 0780337948 (case)
078033793X (soft)
0780337956 (microfiche)
ISSN: 1065-2221
Title: Semiconductor thermal measurement and management 13th Annual symposium : Jan 1997, Austin, TX.
Author Heading: Institute of Electrical and Electronics Engineers. Components, Packaging, & Manufacturing Technology Society (CPMT)
Publication, Distribution, etc.: IEEE
Publication Date: 1997.
Publication Date (W3CDTF): 1997
Extent: v.
Alternative Title: Also known as SEMITHERM or SEMI-THERM. Held on fiche. IEEE cat no 97CM36031
semiconductor thermal measurement ; IEEE ; SEMI THERM ; SEMITHERM
Note (Material Type): [microform]
NDLC: M17
M191
Note (General): Papers.
Also known as SEMITHERM or SEMI-THERM. Held on fiche. IEEE cat no 97CM36031.
Index term: semiconductor thermal measurement ; IEEE ; SEMI THERM ; SEMITHERM.
BL shelfmark: 1086.2337 13th 1997.
Holding library: 国立国会図書館
Call No.: M17-97-1186-LS
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003505237
http://id.ndl.go.jp/bib/000003505237
UKMARC No.: G05239081
Bibliographic Record Category (NDL): 215