Microelectronic test structures International conference : Mar 1997, Monterey, CA.

Author: Institute of Electrical and Electronics Engineers. Electron Devices Society.

Notes on use

Note (General)：: Papers.Also known as ICMTS. Held on fiche. IEEE cat no 97CM35914.Index term: microelectronic test structures ; ICMTS ; IEEE....

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Material Type: 図書
ISBN: 078033244X (casebound)
0780332431 (softbound)
0780332458 (microfiche)
Title: Microelectronic test structures International conference : Mar 1997, Monterey, CA.
Author Heading: Institute of Electrical and Electronics Engineers. Electron Devices Society.
Publication, Distribution, etc.: IEEE
Publication Date: 1997.
Publication Date (W3CDTF): 1997
Extent: v.
Alternative Title: Also known as ICMTS. Held on fiche. IEEE cat no 97CM35914
microelectronic test structures ; ICMTS ; IEEE
Note (Material Type): [microform]
NDLC: M17
ND
Note (General): Papers.
Also known as ICMTS. Held on fiche. IEEE cat no 97CM35914.
Index term: microelectronic test structures ; ICMTS ; IEEE.
BL shelfmark: 6844.16712 1997.
Holding library: 国立国会図書館
Call No.: M17-97-2060-LS
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003505258
http://id.ndl.go.jp/bib/000003505258
UKMARC No.: G05338483
Bibliographic Record Category (NDL): 215