Statistical metrology : 2nd International workshop : Jun 1997, Kyoto, Japan.

Author: Institute of Electrical and Electronics Engineers. Electron Devices Society.

Notes on use

Note (General)：: Papers and programme.Also known as IWSM '97. IEEE cat no 97TH8246.Index term: statistical metrology ; IWSM ; IEEE....

Search by Bookstore

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
ISBN: 0780337379 (pbk)
0780337387 (microfiche)
Title: Statistical metrology : 2nd International workshop : Jun 1997, Kyoto, Japan.
Author Heading: Institute of Electrical and Electronics Engineers. Electron Devices Society.
Publication, Distribution, etc.: IEEE
Publication Date: 1997.
Publication Date (W3CDTF): 1997
Extent: v.
Alternative Title: Also known as IWSM '97. IEEE cat no 97TH8246
statistical metrology ; IWSM ; IEEE
NDLC: M17
MA
Note (General): Papers and programme.
Also known as IWSM '97. IEEE cat no 97TH8246.
Index term: statistical metrology ; IWSM ; IEEE.
BL shelfmark: 4552.2051 2nd 1997.
Holding library: 国立国会図書館
Call No.: M17-98-2095
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003507038
http://id.ndl.go.jp/bib/000003507038
UKMARC No.: G05443852
Bibliographic Record Category (NDL): 215