Surface characterization for computer disks, wafers, and flat panel displays : Conference : Jan 1999, San Jose, CA. (SPIE Proceedings ; 3619)

Surface characterization for computer disks, wafers, and flat panel displays : Conference : Jan 1999, San Jose, CA.

(SPIE Proceedings ; 3619)

Notes on use

Note (General)：: Selected papers.Index term: SPIE ; computer disks ; flat panel displays ; surface characterization.BL shelfmark: 6823.100 vol 3619 1999.

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Material Type: 図書
ISBN: 0819430897 (pbk)
ISSN: 0277-786X
Title: Surface characterization for computer disks, wafers, and flat panel displays : Conference : Jan 1999, San Jose, CA.
Series Title: SPIE Proceedings ; 3619
Author Heading: SPIE-The International Society for Optical Engineering.
Publication, Distribution, etc.: SPIE
Publication Date: 1999.
Publication Date (W3CDTF): 1999
Extent: v.
Alternative Title: SPIE ; computer disks ; flat panel displays ; surface characterization
NDLC: M17
ND
Note (General): Selected papers.
Index term: SPIE ; computer disks ; flat panel displays ; surface characterization.
BL shelfmark: 6823.100 vol 3619 1999.
Holding library: 国立国会図書館
Call No.: M17-99-1170
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003508699
http://id.ndl.go.jp/bib/000003508699
UKMARC No.: G05792888
Bibliographic Record Category (NDL): 215