図書

Optical measurement systems for industrial inspection : Conference : Jun 1999, Munich, Germany. (SPIE Proceedings ; 3824)

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Optical measurement systems for industrial inspection : Conference : Jun 1999, Munich, Germany.

(SPIE Proceedings ; 3824)

Call No. (NDL)
M17-00-0052
Bibliographic ID of National Diet Library
000003509833
Material type
図書
Author
SPIE-The International Society for Optical Engineering.ほか
Publisher
SPIE
Publication date
1999.
Material Format
Paper
Capacity, size, etc.
v.
NDC
-
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Note (General):

Papers.(EUROPTO Series)Index term: optical measurement systems ; SPIE ; industrial inspection ; EOS....

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Paper

Material Type
図書
ISBN
0819433101 (pbk)
ISSN
0277-786X
Publication, Distribution, etc.
Publication Date
1999.
Publication Date (W3CDTF)
1999
Extent
v.