Optoelectronic metrology : Conference : Sep 1998, Lancut, Poland. (SPIE Proceedings ; 4018)

Optoelectronic metrology : Conference : Sep 1998, Lancut, Poland.

(SPIE Proceedings ; 4018)

Author: SPIE-The International Society for Optical Engineering. Poland Chapter.ほか

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Note (General)：: Papers.Also known as OEM '98.Index term: optoelectronic metrology ; SPIE ; OEM....

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Material Type: 図書
ISBN: 0819436445 (pbk)
ISSN: 0277-786X
Title: Optoelectronic metrology : Conference : Sep 1998, Lancut, Poland.
Series Title: SPIE Proceedings ; 4018
Author Heading: SPIE-The International Society for Optical Engineering. Poland Chapter.
Committee for Scientific Research, Poland.
Military University of Technology. Institute of Optoelectronics.
Publication, Distribution, etc.: SPIE
Publication Date: 1998.
Publication Date (W3CDTF): 1998
Extent: v.
Alternative Title: Also known as OEM '98
optoelectronic metrology ; SPIE ; OEM
NDLC: M17
MC
Note (General): Papers.
Also known as OEM '98.
Index term: optoelectronic metrology ; SPIE ; OEM.
BL shelfmark: 6823.100 vol 4018 1998.
Holding library: 国立国会図書館
Call No.: M17-00-0721
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003510538
http://id.ndl.go.jp/bib/000003510538
UKMARC No.: G05944255
Bibliographic Record Category (NDL): 215