Optical design and testing : 15-18 October, 2002, Shanghai, China. : Oct 2002, Shanghai, China. (SPIE Proceedings ; 4927)

Optical design and testing : 15-18 October, 2002, Shanghai, China. : Oct 2002, Shanghai, China.

(SPIE Proceedings ; 4927)

Notes on use

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
ISBN: 0819447161
ISSN (series): 0277-786X
Title: Optical design and testing : 15-18 October, 2002, Shanghai, China. : Oct 2002, Shanghai, China.
Series Title: SPIE Proceedings ; 4927
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering. v. 4927.
Author Heading: Weng, Zhicheng.
Sasian, Jose M.
Wang, Yongtian.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2002.
Publication Date (W3CDTF): 2002
Extent: xvii, 868 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Optical instruments -- Design and construction -- Congresses.
Optical instruments -- Testing. -- Congresses.
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographic references and author index.
Holding library: 国立国会図書館
Call No.: M17-03-310
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004006142
http://id.ndl.go.jp/bib/000004006142
RLIN No.: MOHG51054252-B
Bibliographic Record Category (NDL): 215