ICMTS 2002 : proceedings of the 2002 international conference on microelectronic test structures : April 8-11, 2002 : Cork, Ireland. : 15th ICMTS : Apr 2002, Cork, Ireland.

Author: IEEE International Conference on Microelectronic Test Structures (2002 : Cork, Ireland)

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Note (General)：: Papers.Related URL: http: //ieeexplore.ieee.org/servlet/opac?punumber=8488.IEEE cat no 02CH37357.

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Material Type: 図書
ISBN: 0780374649
Title: ICMTS 2002 : proceedings of the 2002 international conference on microelectronic test structures : April 8-11, 2002 : Cork, Ireland. : 15th ICMTS : Apr 2002, Cork, Ireland.
Author Heading: IEEE International Conference on Microelectronic Test Structures (2002 : Cork, Ireland)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2002.
Publication Date (W3CDTF): 2002
Extent: x, 254 p. : ill. ; 29 cm.
Accompanying material: Errata sheet has tipped in.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Testing. -- Congresses.
Semiconductors -- Testing -- Congresses.
Electronic apparatus and appliances -- Testing. -- Congresses.
NDLC: M17
Note (General): Papers.
Related URL: http: //ieeexplore.ieee.org/servlet/opac?punumber=8488.
IEEE cat no 02CH37357.
Note (Bibliography): Includes bibliographic references and author index.
Note (Additional Physical Form Available): Also available via the World Wide Web.
Holding library: 国立国会図書館
Call No.: M17-03-1788
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004151379
http://id.ndl.go.jp/bib/000004151379
LC Control Number: 2002103147
https://lccn.loc.gov/2002103147
RLIN No.: MOHG52094005-B
Bibliographic Record Category (NDL): 215