2002 IEEE international integrated reliability workshop : final report : Stanford Sierra Camp : Lake Tahoe, California : October 21-24, 2002. : 2002 IRW : Oct 2002, ------.

Author: International Integrated Reliability Workshop (2002 : Lake Tahoe, Calif.)

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Material Type: 図書
ISBN: 0780375580 (softbound)
Title: 2002 IEEE international integrated reliability workshop : final report : Stanford Sierra Camp : Lake Tahoe, California : October 21-24, 2002. : 2002 IRW : Oct 2002, ------.
Author Heading: International Integrated Reliability Workshop (2002 : Lake Tahoe, Calif.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2002.
Publication Date (W3CDTF): 2002
Extent: v, 214 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Reliability -- Congresses.
Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.
NDLC: M17
Note (General): Papers.
Held at Lake Tahoe, CA, USA.
IEEE cat no 02TH8634.
Note (Bibliography): Includes bibliographical references.
Note (Additional Physical Form Available): Also available via the World Wide Web.
Holding library: 国立国会図書館
Call No.: M17-04-70
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004180431
http://id.ndl.go.jp/bib/000004180431
LC Control Number: 2002106802
https://lccn.loc.gov/2002106802
RLIN No.: NYCXV4598057-B
Bibliographic Record Category (NDL): 215