Proceedings of the 2001 8th international symposium on the physical & failure analysis of integrated circuits : IPFA 2001. : Jul 2001, Singapore.

Call No. (NDL): M17-03-3241
Bibliographic ID of National Diet Library: 000004186503

Material type: 図書

Author: IEEE Singapore Section. Reliability/CPMT/ED Chapter.ほか

Publisher: IEEE

Publication date: c2001.

Material Format: Paper

Capacity, size, etc.: 262 p. : ill. ; 30 cm.

NDC: -

View All

Notes on use

Note (General)：: Papers.IEEE cat no 01TH8548.

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 0780366751
Title: Proceedings of the 2001 8th international symposium on the physical & failure analysis of integrated circuits : IPFA 2001. : Jul 2001, Singapore.
Author Heading: IEEE Singapore Section. Reliability/CPMT/ED Chapter.
Tan, Wilson.
International Symposium on the Physical & Failure Analysis of Integrated Circuits (8th : 2001 : Singapore)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2001.
Publication Date (W3CDTF): 2001
Extent: 262 p. : ill. ; 30 cm.
Alternative Title: Proceedings of the 2001 8th international symposium on the physical and failure analysis of integrated circuits : IPFA 2001
IPFA 2001 proceedings : 8th international symposium on the physical & failure analysis of integrated circuits : 9-13 July 2001 the Westin Stamford & Westin Plaza, Singapore
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Defects -- Congresses.
Integrated circuits -- Testing -- Congresses.
NDLC: M17
Note (General): Papers.
IEEE cat no 01TH8548.
Note (Bibliography): Includes bibliographic references and author index.
Note (Additional Physical Form Available): Also available via the World Wide Web.
Holding library: 国立国会図書館
Call No.: M17-03-3241
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004186503
http://id.ndl.go.jp/bib/000004186503
LC Control Number: 00110824
https://lccn.loc.gov/00110824
RLIN No.: NYCGATP8734-B
Bibliographic Record Category (NDL): 215