図書

Noise in devices and circuits : 2-4 June 2003 :, Santa Fe, New Mexico, USA. : SPIE's 1st international symposium on fluctuations and noise : Jun 2003, Santa Fe, NM. (SPIE Proceedings ; 5113)

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Noise in devices and circuits : 2-4 June 2003 :, Santa Fe, New Mexico, USA. : SPIE's 1st international symposium on fluctuations and noise : Jun 2003, Santa Fe, NM.

(SPIE Proceedings ; 5113)

Call No. (NDL)
M17-04-226
Bibliographic ID of National Diet Library
000004190219
Material type
図書
Author
Deen, M. Jamal.ほか
Publisher
SPIE
Publication date
c2003.
Material Format
Paper
Capacity, size, etc.
xxi, 516 p. : ill. ; 28 cm.
NDC
-
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Papers."These are the proceedings for the conference on Noise in Devices and Circuits, part of SPIE's 1st International Symposium on Fluctuations and ...

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Paper

Material Type
図書
ISBN
0819449733
ISSN (series)
0277-786X
Publication, Distribution, etc.
Publication Date
c2003.
Publication Date (W3CDTF)
2003