Noise in devices and circuits : 2-4 June 2003 :, Santa Fe, New Mexico, USA. : SPIE's 1st international symposium on fluctuations and noise : Jun 2003, Santa Fe, NM. (SPIE Proceedings ; 5113)

Noise in devices and circuits : 2-4 June 2003 :, Santa Fe, New Mexico, USA. : SPIE's 1st international symposium on fluctuations and noise : Jun 2003, Santa Fe, NM.

(SPIE Proceedings ; 5113)

Call No. (NDL): M17-04-226
Bibliographic ID of National Diet Library: 000004190219

Material type: 図書

Author: Deen, M. Jamal.ほか

Publisher: SPIE

Publication date: c2003.

Material Format: Paper

Capacity, size, etc.: xxi, 516 p. : ill. ; 28 cm.

NDC: -

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Note (General)：: Papers."These are the proceedings for the conference on Noise in Devices and Circuits, part of SPIE's 1st International Symposium on Fluctuations and ...

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Paper

Material Type: 図書
ISBN: 0819449733
ISSN (series): 0277-786X
Title: Noise in devices and circuits : 2-4 June 2003 :, Santa Fe, New Mexico, USA. : SPIE's 1st international symposium on fluctuations and noise : Jun 2003, Santa Fe, NM.
Series Title: SPIE Proceedings ; 5113
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering. v. 5113.
Author Heading: Deen, M. Jamal.
Çelik-Butler, Zeynep.
Levinshtein, Michael E.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2003.
Publication Date (W3CDTF): 2003
Extent: xxi, 516 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Electronic circuits -- Noise -- Congresses.
Electronic noise -- Congresses.
Electric circuits -- Noise -- Congresses.
Electric noise -- Congresses.
NDLC: M17
Note (General): Papers.
"These are the proceedings for the conference on Noise in Devices and Circuits, part of SPIE's 1st International Symposium on Fluctuations and Noise." -- Introd.
Note (Bibliography): Includes bibliographic references and author index.
Holding library: 国立国会図書館
Call No.: M17-04-226
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004190219
http://id.ndl.go.jp/bib/000004190219
RLIN No.: MOHG52612998-B
Bibliographic Record Category (NDL): 215