ICMTS 2003 : proceedings of the 2003 international conference on microelectronic test structures : March 17-20, 2003 : DoubleTree Hotel Monterey, California. : Mar 2003, Monterey, CA.

Author: IEEE International Conference on Microelectronic Test Structures (2003 : Monterey, California)

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Note (General)：: Papers."2003 international conference on microelectronic test structures : digest of technical papers" -- t. p. verso."ICMTS 2003 is the 16th time ICM...

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Material Type: 図書
ISBN: 0780376536
Title: ICMTS 2003 : proceedings of the 2003 international conference on microelectronic test structures : March 17-20, 2003 : DoubleTree Hotel Monterey, California. : Mar 2003, Monterey, CA.
Author Heading: IEEE International Conference on Microelectronic Test Structures (2003 : Monterey, California)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2003.
Publication Date (W3CDTF): 2003
Extent: 249 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Testing. -- Congresses.
Semiconductors -- Testing -- Congresses.
Electronic apparatus and appliances -- Testing. -- Congresses.
NDLC: M17
Note (General): Papers.
"2003 international conference on microelectronic test structures : digest of technical papers" -- t. p. verso.
"ICMTS 2003 is the 16th time ICMTS will be held as an international conference." -- Chairman's letter.
IEEE cat no 03CH37402.
Note (Bibliography): Includes bibliographic references and author index.
Holding library: 国立国会図書館
Call No.: M17-04-254
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004190239
http://id.ndl.go.jp/bib/000004190239
RLIN No.: MOHG52088222-B
Bibliographic Record Category (NDL): 215