Noise in complex systems and stochastic dynamics : 2-4 June 2003 : Santa Fe, New Mexico, USA. : SPIE's 2003 symposium on fluctuations and noise (FaN) : Jun 2003, Santa Fe, NM. (SPIE Proceedings ; 5114)

Noise in complex systems and stochastic dynamics : 2-4 June 2003 : Santa Fe, New Mexico, USA. : SPIE's 2003 symposium on fluctuations and noise (FaN) : Jun 2003, Santa Fe, NM.

(SPIE Proceedings ; 5114)

Call No. (NDL): M17-04-265
Bibliographic ID of National Diet Library: 000004190240

Material type: 図書

Author: Schimansky-Geier, Lutz, 1950-

Publisher: SPIE

Publication date: c2003.

Material Format: Paper

Capacity, size, etc.: xxi, 534 p. : ill. ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Papers."This conference was part of SPIE's 2003 Symposium on Fluctuations and Noise (FaN) , " -- Introd.

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Paper

Material Type: 図書
ISBN: 0819449741
ISSN (series): 0277-786X
Title: Noise in complex systems and stochastic dynamics : 2-4 June 2003 : Santa Fe, New Mexico, USA. : SPIE's 2003 symposium on fluctuations and noise (FaN) : Jun 2003, Santa Fe, NM.
Series Title: SPIE Proceedings ; 5114
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering. v. 5114.
Author Heading: Schimansky-Geier, Lutz, 1950-
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2003.
Publication Date (W3CDTF): 2003
Extent: xxi, 534 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Electronic noise -- Congresses.
Nonlinear systems -- Noise -- Congresses.
Stochastic processes. -- Congresses.
System analysis. -- Congresses.
NDLC: M17
Note (General): Papers.
"This conference was part of SPIE's 2003 Symposium on Fluctuations and Noise (FaN) , " -- Introd.
Note (Bibliography): Includes bibliographic references and author index.
Holding library: 国立国会図書館
Call No.: M17-04-265
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004190240
http://id.ndl.go.jp/bib/000004190240
RLIN No.: MOHG52689936-B
Bibliographic Record Category (NDL): 215