Proceedings of the 9th international symposium on the physical & failure analysis of integrated circuits : IPFA 2002. : Jul 2002, Singapore.

• Material Type: 図書
• ISBN: 0780374169
• Title: Proceedings of the 9th international symposium on the physical & failure analysis of integrated circuits : IPFA 2002. : Jul 2002, Singapore.
• Author Heading: IEEE Singapore Section. Reliability/CPMT/ED Chapter.; Thong, John.; International Symposium on the Physical & Failure Analysis of Integrated Circuits (9th : 2002 : Singapore)
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2002.
• Publication Date (W3CDTF): 2002
• Extent: 258 p. : ill. ; 30 cm.
• Alternative Title: Proceedings of the 9th international symposium on the physical and failure analysis of integrated circuits : IPFA 2002; 9th international symposium on the physical & failure analysis of integrated circuits : IPFA 2002 proceedings : 8-12 July 2002 : Raffles City Convention Centre : Singapore
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing -- Congresses.
• NDLC: M17
• Note (General): Papers.; IEEE cat no 02TH8614.
• Note (Bibliography): Includes bibliographic references and author index.
• Note (Additional Physical Form Available): Also available via the World Wide Web.
• Holding library: 国立国会図書館
• Call No.: M17-03-4302
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000004203707; http://id.ndl.go.jp/bib/000004203707
• LC Control Number: 2002100970; https://lccn.loc.gov/2002100970
• RLIN No.: NYCXV4355225-B
• Bibliographic Record Category (NDL): 215