2001 IEEE international integrated reliability workshop final report : Stanford Sierra Camp : Lake Tahoe, California : October 15-18, 2001. : Oct 2001, ------.

Author: International Integrated Reliability Workshop (2001 : Lake Tahoe, CA)

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Note (General)：: Papers and abstracts.Held at Lake Tahoe, CA.IEEE cat no 01TH8580.

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Material Type: 図書
ISBN: 0780371674 (souftbound)
Title: 2001 IEEE international integrated reliability workshop final report : Stanford Sierra Camp : Lake Tahoe, California : October 15-18, 2001. : Oct 2001, ------.
Author Heading: International Integrated Reliability Workshop (2001 : Lake Tahoe, CA)
Publication, Distribution, etc.: Piscataway : IEEE Electron Devices Society
Piscataway : IEEE Reliability Society
Publication Date: c2001.
Publication Date (W3CDTF): 2001
Extent: v, 106 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Reliability -- Congresses.
Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.
LCC: TK7874
NDLC: M17
Note (General): Papers and abstracts.
Held at Lake Tahoe, CA.
IEEE cat no 01TH8580.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-03-5070
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004204076
http://id.ndl.go.jp/bib/000004204076
LC Control Number: 2001092279
https://lccn.loc.gov/2001092279
RLIN No.: NYCGAUL5592-B
Bibliographic Record Category (NDL): 215