図書

Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA. (SPIE Proceedings ; 4648)

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Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA.

(SPIE Proceedings ; 4648)

Call No. (NDL)
M17-03-3688
Bibliographic ID of National Diet Library
000004207708
Material type
図書
Author
Chin, Aland K.
Publisher
SPIE
Publication date
c2002.
Material Format
Paper
Capacity, size, etc.
viii, 180 p. : ill. ; 28 cm.
NDC
-
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Paper

Material Type
図書
ISBN
0819443875
ISSN (series)
0277-786X
Author Heading
Publication, Distribution, etc.
Publication Date
c2002.
Publication Date (W3CDTF)
2002