Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA. (SPIE Proceedings ; 4648)

Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA.

(SPIE Proceedings ; 4648)

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Material Type: 図書
ISBN: 0819443875
ISSN (series): 0277-786X
Title: Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA.
Series Title: SPIE Proceedings ; 4648
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 4648.
Author Heading: Chin, Aland K.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2002.
Publication Date (W3CDTF): 2002
Extent: viii, 180 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Optoelectronic devices -- Testing -- Congresses.
Optoelectronic devices -- Reliability -- Congresses.
LCC: TK8300
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-03-3688
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004207708
http://id.ndl.go.jp/bib/000004207708
RLIN No.: CTYAXAJ2224-B
Bibliographic Record Category (NDL): 215