Defect and impurity engineered semiconductors and devices 3 : symposium held April 1-5, 2002, San Francisco, California, U.S.A. : symposium F "defect and impurity engineered semiconductors and devices 3" : 2002 MRS spring meeting : Apr 2002, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 719)

Defect and impurity engineered semiconductors and devices 3 : symposium held April 1-5, 2002, San Francisco, California, U.S.A. : symposium F "defect and impurity engineered semiconductors and devices 3" : 2002 MRS spring meeting : Apr 2002, San Francisco, CA.

(Materials Research Society Symposia Proceedings ; 719)

Call No. (NDL): M17-03-4530
Bibliographic ID of National Diet Library: 000004234098

Material type: 図書

Author: Ashok, S.ほか

Publisher: Materials Research Society

Publication date: c2002.

Material Format: Paper

Capacity, size, etc.: xv, 493 p. : ill. ; 24 cm.

NDC: -

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Notes on use

Note (General)：: Selected papers."This volume results from Symposium F, 'Defect and Impurity Engineered Semiconductors and Devices III, ' held April 1-5 at the 2002 MR...

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Paper

Material Type: 図書
ISBN (error code): 1558996659
Title: Defect and impurity engineered semiconductors and devices 3 : symposium held April 1-5, 2002, San Francisco, California, U.S.A. : symposium F "defect and impurity engineered semiconductors and devices 3" : 2002 MRS spring meeting : Apr 2002, San Francisco, CA.
Series Title: Materials Research Society Symposia Proceedings ; 719
Title Heading: Materials Research Society symposia proceedings ; v. 719.
Author Heading: Ashok, S.
Materials Research Society. Meeting (2002 : San Francisco, California)
Symposium on Defect and Impurity Engineered Semiconductors and Devices (3rd : 2002 : San Francisco, California)
Publication, Distribution, etc.: Warrendale : Materials Research Society
Publication Date: c2002.
Publication Date (W3CDTF): 2002
Extent: xv, 493 p. : ill. ; 24 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductors -- Congresses.
Semiconductors -- Defects -- Congresses.
Semiconductors -- Impurity distribution -- Congresses.
LCC: TK7871.85
NDLC: M17
Note (General): Selected papers.
"This volume results from Symposium F, 'Defect and Impurity Engineered Semiconductors and Devices III, ' held April 1-5 at the 2002 MRS Spring Meeting in San Francisco, California." -- Preface.
Note (Bibliography): Includes bibliographic references and indexes.
Holding library: 国立国会図書館
Call No.: M17-03-4530
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004234098
http://id.ndl.go.jp/bib/000004234098
RLIN No.: PAUGV3251990-B
Bibliographic Record Category (NDL): 215