20th IEEE VLSI test symposium (VTS 2002) : proceedings : 28 April - 2 May 2002 : Monterey, California. : Apr 2002, Monterey, CA. (IEEE VLSI Test Symposium)

20th IEEE VLSI test symposium (VTS 2002) : proceedings : 28 April - 2 May 2002 : Monterey, California. : Apr 2002, Monterey, CA.

(IEEE VLSI Test Symposium)

Call No. (NDL): M17-03-4439
Bibliographic ID of National Diet Library: 000004235417

Material type: 図書

Author: IEEE VLSI Test Symposium (20th : 2002 : Monterey, Calif.)

Publisher: IEEE Computer Society

Publication date: c2002.

Material Format: Paper

Capacity, size, etc.: xxxvii, 452 p. : ill. ; 28 cm.

NDC: -

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Note (General)：: Papers.IEEE cat no PRO1570.

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Paper

Material Type: 図書
ISBN: 0769515703
0769515711 (case)
076951572X (microfiche)
ISSN (series): 1093-0167
Title: 20th IEEE VLSI test symposium (VTS 2002) : proceedings : 28 April - 2 May 2002 : Monterey, California. : Apr 2002, Monterey, CA.
Series Title: IEEE VLSI Test Symposium
Author Heading: IEEE VLSI Test Symposium (20th : 2002 : Monterey, Calif.)
Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
Publication Date: c2002.
Publication Date (W3CDTF): 2002
Extent: xxxvii, 452 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
LCC: TK7874
NDLC: M17
Note (General): Papers.
IEEE cat no PRO1570.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-03-4439
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004235417
http://id.ndl.go.jp/bib/000004235417
RLIN No.: NYCGAUQ3385-B
Bibliographic Record Category (NDL): 215