Surface scattering and diffraction for advanced metrology : 1 August 2001 : San Diego, USA. : Aug 2001, San Diego, CA.

• Material Type: 図書
• ISBN: 0819441619
• ISSN (series): 0277-786X
• Title: Surface scattering and diffraction for advanced metrology : 1 August 2001 : San Diego, USA. : Aug 2001, San Diego, CA.
• Series Title: SPIE Proceedings ; 4447
• Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 4447.
• Author Heading: Gu, Zu-Han.; Maradudin, A. A.
• Publication, Distribution, etc.: Bellingham : SPIE
• Publication Date: c2001.
• Publication Date (W3CDTF): 2001
• Extent: vii, 164 p. : ill. ; 28 cm.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Surface roughness -- Measurement -- Congresses.; Diffractive scattering -- Congresses.; Optical measurements -- Congresses.; Scattering (Physics) -- Congresses.; Metrology -- Congresses.
• LCC: TA418.7
• NDLC: M17
• Note (General): Papers.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-03-4990
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000004247714; http://id.ndl.go.jp/bib/000004247714
• RLIN No.: CTYAFPG4591-B
• Bibliographic Record Category (NDL): 215