Technologies for synthetic environments: hardware-in-the-loop testing 8 : 21-22 April 2003 : Orlando, Florida, USA. : Apr 2003, Orlando, FL. (SPIE Proceedings ; 5092)

Technologies for synthetic environments: hardware-in-the-loop testing 8 : 21-22 April 2003 : Orlando, Florida, USA. : Apr 2003, Orlando, FL.

(SPIE Proceedings ; 5092)

Call No. (NDL): M17-04-861
Bibliographic ID of National Diet Library: 000004254644

Material type: 図書

Author: Murrer, Robert Lee.

Publisher: SPIE

Publication date: c2003.

Material Format: Paper

Capacity, size, etc.: viii, 322 p. : ill. ; 28 cm.

NDC: -

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Note (General)：: Selected papers.

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Paper

Material Type: 図書
ISBN: 0819449520
ISSN (series): 0277-786X
Title: Technologies for synthetic environments: hardware-in-the-loop testing 8 : 21-22 April 2003 : Orlando, Florida, USA. : Apr 2003, Orlando, FL.
Series Title: SPIE Proceedings ; 5092
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering. v. 5092.
Author Heading: Murrer, Robert Lee.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2003.
Publication Date (W3CDTF): 2003
Extent: viii, 322 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Guided missiles -- Testing -- Congresses.
Infrared detectors. -- Congresses.
Guidance systems (Flight) -- Congresses.
NDLC: M17
Note (General): Selected papers.
Note (Bibliography): Includes bibliographic references and author index.
Holding library: 国立国会図書館
Call No.: M17-04-861
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004254644
http://id.ndl.go.jp/bib/000004254644
RLIN No.: MOHG53126127-B
Bibliographic Record Category (NDL): 215