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図書

Defect localization capabilities of a global detection scheme [microform] : spatial pattern recognition using full-field vibration test data in plates / A.F. Saleeb and M. Prabhu (NASA/TM-2002-211685)

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Defect localization capabilities of a global detection scheme [microform] : spatial pattern recognition using full-field vibration test data in plates / A.F. Saleeb and M. Prabhu

(NASA/TM-2002-211685)

Call No. (NDL)
YCA-NAS 1.15:2002-211685
Bibliographic ID of National Diet Library
000004260614
Material type
図書
Author
Saleeb, Atef F. (Atef Fatthy) , 1952-ほか
Publisher
-
Publication date
2002
Material Format
Microform
Capacity, size, etc.
2 microfiches ; 11 × 15 cm
NDC
-
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Notes on use

Note (General):

Government document call number: NAS 1.26: 211685Physical description for original version : 1 vShipping list no.: 2003-0313-M...

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Microform

Material Type
図書
Publication Date (W3CDTF)
2002
Extent
2 microfiches
Size
11 × 15 cm
Alternative Title
Spatial pattern recognition using full field vibration test data in plates
Place of Publication (Country Code)
US