ICMTS 2001 : proceedings of the 2001 international conference on microelectronic test structures : March 19-22, 2001 : Kobe, Japan. Mar 2001, Kobe, Japan.

Author: IEEE International Conference on Microelectronic Test Structures (2001 : Kobe, Japan)

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Material Type: 図書
ISBN: 0780365127 (microfiche edition)
0780365119
Title: ICMTS 2001 : proceedings of the 2001 international conference on microelectronic test structures : March 19-22, 2001 : Kobe, Japan. Mar 2001, Kobe, Japan.
Author Heading: IEEE International Conference on Microelectronic Test Structures (2001 : Kobe, Japan)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2001.
Publication Date (W3CDTF): 2001
Extent: 4 microfiches (276 fr.) ; 11 x 15 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Integrated circuits -- Testing -- Congresses.
Semiconductors -- Testing -- Congresses.
Electronic apparatus and appliances -- Testing -- Congresses.
NDLC: M17
Note (General): Papers.
IEEE cat no 01CM37153 (microfiche) , 01CH37153.
Note (Additional Physical Form Available): Also available via the World Wide Web: http: //www.ee.ed.ac.uk./ICMTS.
Holding library: 国立国会図書館
Call No.: M17-LS-03-9
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004262143
http://id.ndl.go.jp/bib/000004262143
LC Control Number: 00105649
https://lccn.loc.gov/00105649
RLIN No.: NYPGR47627099-B
Bibliographic Record Category (NDL): 215