図書

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003 : San Diego, California, USA. : annual SPIE conference on advanced characterization techniques for optics, semiconductors, and nanotechnologies : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5188)

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Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003 : San Diego, California, USA. : annual SPIE conference on advanced characterization techniques for optics, semiconductors, and nanotechnologies : Aug 2003, San Diego, CA.

(SPIE Proceedings ; 5188)

Call No. (NDL)
M17-04-1398
Bibliographic ID of National Diet Library
000004314806
Material type
図書
Author
Duparré, Angela.ほか
Publisher
SPIE
Publication date
c2003.
Material Format
Paper
Capacity, size, etc.
x, 402 p. : ill. ; 28 cm.
NDC
-
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Paper

Material Type
図書
ISBN
0819450618
ISSN (series)
0277-786X
Title
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003 : San Diego, California, USA. : annual SPIE conference on advanced characterization techniques for optics, semiconductors, and nanotechnologies : Aug 2003, San Diego, CA.
Series Title
SPIE Proceedings ; 5188
Title Heading
Proceedings of SPIE -- the International Society for Optical Engineering. v. 5188.
Author Heading
Duparré, Angela.
Singh, Bhanwar.
Publication, Distribution, etc.
Bellingham : SPIE
Publication Date
c2003.
Publication Date (W3CDTF)
2003