Measuring atomic properties with an atom interferometer

Capacity, size, etc.: 2 microfiches (191 fr.) : negative, ill. ; 11 x 15 cm.

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Material Type: 博士論文
Title: Measuring atomic properties with an atom interferometer
Author/Editor: Tony David Roberts.
Author Heading: Roberts, Tony David.
Publication, Distribution, etc.: Cambridge : Massachusetts Institute of Technology
Publication Date: 2002.
Extent: 2 microfiches (191 fr.) : negative, ill. ; 11 x 15 cm.
Degree grantor/type: Massachusetts Institute of Technology
Date Granted: 2002.
Date Granted (W3CDTF): 2002
Note (Dissertation): 博士論文
Thesis (doctoral) --Massachusetts Institute of Technology, 2002.
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Note (Bibliography): Includes bibliographies.
Holding library: 国立国会図書館
Call No.: LS-DIMIT-02-324
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004359181
http://id.ndl.go.jp/bib/000004359181
Bibliographic Record Category (NDL): 216