Analysis of Defect Structure in Silicon. Effect of Grain Boundary Density on Carrier Mobility in Ucp Material. Interim Report NASA-CR-169923 N83-19617 NAS-126169923 JPL-9950753

Analysis of Defect Structure in Silicon. Effect of Grain Boundary Density on Carrier Mobility in Ucp Material. Interim Report

NASA-CR-169923 N83-19617 NAS-126169923 JPL-9950753

Call No. (NDL): LS-N83/19617
Bibliographic ID of National Diet Library: 000004939990

Material type: 規格・テクニカルリポート類

Author: Dunn, Jほか

Publisher: -

Publication date: -

Material Format: Microform

Capacity, size, etc.: microfiche 26 p

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Material Type: 規格・テクニカルリポート類
Title: Analysis of Defect Structure in Silicon. Effect of Grain Boundary Density on Carrier Mobility in Ucp Material. Interim Report
Author/Editor: Dunn, J
Stringfellow, G. B
Natesh, R
Extent: microfiche 26 p
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NASA-CR-169923
テクニカルリポート番号 : N83-19617
テクニカルリポート番号 : NAS-126169923
テクニカルリポート番号 : JPL-9950753
Holding library: 国立国会図書館
Call No.: LS-N83/19617
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004939990
http://id.ndl.go.jp/bib/000004939990
Bibliographic Record Category (NDL): 291