Analysis of Defect Structure in Silicon. Characterization of Semix Material. Silicon Sheet Growth Development for the Large Area Silicon Sheet Task of the Low-Cost Solar Array Project. Final Report NASA-CR-170239 N83-23700 NAS-126170239 JPL-9950808

Analysis of Defect Structure in Silicon. Characterization of Semix Material. Silicon Sheet Growth Development for the Large Area Silicon Sheet Task of the Low-Cost Solar Array Project. Final Report

NASA-CR-170239 N83-23700 NAS-126170239 JPL-9950808

Call No. (NDL): LS-N83/23700
Bibliographic ID of National Diet Library: 000004940177

Material type: 規格・テクニカルリポート類

Author: Natesh, Rほか

Publisher: -

Publication date: -

Material Format: Microform

Capacity, size, etc.: microfiche 138 p

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: Analysis of Defect Structure in Silicon. Characterization of Semix Material. Silicon Sheet Growth Development for the Large Area Silicon Sheet Task of the Low-Cost Solar Array Project. Final Report
Author/Editor: Natesh, R
Stringfellow, G. B
Virkar, A. V
Dunn, J
Guyer, T
Extent: microfiche 138 p
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NASA-CR-170239
テクニカルリポート番号 : N83-23700
テクニカルリポート番号 : NAS-126170239
テクニカルリポート番号 : JPL-9950808
Holding library: 国立国会図書館
Call No.: LS-N83/23700
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004940177
http://id.ndl.go.jp/bib/000004940177
Bibliographic Record Category (NDL): 291