Measurement and Analysis of Critical Crack Tip Processes during Fatigue Crack Growth. Final rept NASA-CR-172597 N85-32342 NAS-126172597

Measurement and Analysis of Critical Crack Tip Processes during Fatigue Crack Growth. Final rept

NASA-CR-172597 N85-32342 NAS-126172597

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Material Type: 規格・テクニカルリポート類
Title: Measurement and Analysis of Critical Crack Tip Processes during Fatigue Crack Growth. Final rept
Author/Editor: Davidson, D. L
Hudak, S. J
Dexter, R. J
Extent: microfiche 108 p
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NASA-CR-172597
テクニカルリポート番号 : N85-32342
テクニカルリポート番号 : NAS-126172597
Holding library: 国立国会図書館
Call No.: LS-N85/32342
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004941628
http://id.ndl.go.jp/bib/000004941628
Bibliographic Record Category (NDL): 291