Technique for Measuring the Dielectric Constant of Thin Materials NASA-CR-183325 N89-10984 NAS-126183325

Technique for Measuring the Dielectric Constant of Thin Materials

NASA-CR-183325 N89-10984 NAS-126183325

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Material Type: 規格・テクニカルリポート類
Title: Technique for Measuring the Dielectric Constant of Thin Materials
Author/Editor: Sarabandi, K
Ulaby, F. T
Extent: microfiche 25 p
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NASA-CR-183325
テクニカルリポート番号 : N89-10984
テクニカルリポート番号 : NAS-126183325
Holding library: 国立国会図書館
Call No.: LS-N89/10984
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004948422
http://id.ndl.go.jp/bib/000004948422
Bibliographic Record Category (NDL): 291