Microcomputer-Based Tests for Repeated-Measures: Metric Properties and Predictive Validities NASA-CR-185517 N90-12174 NAS-126185517 EOTR-8902

Microcomputer-Based Tests for Repeated-Measures: Metric Properties and Predictive Validities

NASA-CR-185517 N90-12174 NAS-126185517 EOTR-8902

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Material Type: 規格・テクニカルリポート類
Title: Microcomputer-Based Tests for Repeated-Measures: Metric Properties and Predictive Validities
Author/Editor: Kennedy, R. S
Baltzley, D. R
Dunlap, W. P
Wilkes, R. L
Kuntz, L
Extent: microfiche 34 p
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NASA-CR-185517
テクニカルリポート番号 : N90-12174
テクニカルリポート番号 : NAS-126185517
テクニカルリポート番号 : EOTR-8902
Holding library: 国立国会図書館
Call No.: LS-N90/12174
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004949603
http://id.ndl.go.jp/bib/000004949603
Bibliographic Record Category (NDL): 291