Study of InGaAs Based MODFET Structures Using Variable Angle Spectroscopic Ellipsometry NASA-TM-103792 N91-19935 NAS-115103792 E-6069

Study of InGaAs Based MODFET Structures Using Variable Angle Spectroscopic Ellipsometry

NASA-TM-103792 N91-19935 NAS-115103792 E-6069

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Material Type: 規格・テクニカルリポート類
Title: Study of InGaAs Based MODFET Structures Using Variable Angle Spectroscopic Ellipsometry
Author/Editor: Alterovitz, S. A
Sieg, R. M
Yao, H. D
Snyder, P. G
Woollam, J. A
Extent: microfiche 13 p
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NASA-TM-103792
テクニカルリポート番号 : N91-19935
テクニカルリポート番号 : NAS-115103792
テクニカルリポート番号 : E-6069
Holding library: 国立国会図書館
Call No.: LS-N91/19935
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004973251
http://id.ndl.go.jp/bib/000004973251
Bibliographic Record Category (NDL): 291