Radiographic Detectability Limits for Seeded Voids in Sintered Silicon Carbide and Silicon Nitride NASA-TM-86945 N85-21674 NAS-11586945 E-2464

Radiographic Detectability Limits for Seeded Voids in Sintered Silicon Carbide and Silicon Nitride

NASA-TM-86945 N85-21674 NAS-11586945 E-2464

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Material Type: 規格・テクニカルリポート類
Title: Radiographic Detectability Limits for Seeded Voids in Sintered Silicon Carbide and Silicon Nitride
Author/Editor: Baaklini, G. Y
Kiser, J. D
Roth, D. J
Extent: microfiche 19 p
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NASA-TM-86945
テクニカルリポート番号 : N85-21674
テクニカルリポート番号 : NAS-11586945
テクニカルリポート番号 : E-2464
Holding library: 国立国会図書館
Call No.: LS-N85/21674
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004982116
http://id.ndl.go.jp/bib/000004982116
Bibliographic Record Category (NDL): 291