Determination of Impurities in Silicon Carbide by ICP AES (Inductively Coupled Plasma Atomic Emission Spectrometry) after Coprecipitation with Lanthanum Hydroxide NASA-TT-20332 N88-29003 NAS-17720332

Determination of Impurities in Silicon Carbide by ICP AES (Inductively Coupled Plasma Atomic Emission Spectrometry) after Coprecipitation with Lanthanum Hydroxide

NASA-TT-20332 N88-29003 NAS-17720332

Call No. (NDL): LS-N88/29003
Bibliographic ID of National Diet Library: 000004995163

Material type: 規格・テクニカルリポート類

Author: Harada, Yほか

Publisher: -

Publication date: -

Material Format: Microform

Capacity, size, etc.: microfiche 20 p

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Microform

Material Type: 規格・テクニカルリポート類
Title: Determination of Impurities in Silicon Carbide by ICP AES (Inductively Coupled Plasma Atomic Emission Spectrometry) after Coprecipitation with Lanthanum Hydroxide
Author/Editor: Harada, Y
Kurata, N
Furuno, G
Extent: microfiche 20 p
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NASA-TT-20332
テクニカルリポート番号 : N88-29003
テクニカルリポート番号 : NAS-17720332
Holding library: 国立国会図書館
Call No.: LS-N88/29003
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004995163
http://id.ndl.go.jp/bib/000004995163
Bibliographic Record Category (NDL): 291