Defect profiling in elemental and multilayer systems: Correlations of fitted defect concentrations with positron implantation profiles BNL-60588 DE94 015844 CONF-940519-81

Defect profiling in elemental and multilayer systems: Correlations of fitted defect concentrations with positron implantation profiles

BNL-60588 DE94 015844 CONF-940519-81

Call No. (NDL): LS-DE94/015844
Bibliographic ID of National Diet Library: 000005497496

Material type: 規格・テクニカルリポート類

Author: Ghosh, V. Jほか

Publisher: -

Publication date: 1994

Material Format: Microform

Capacity, size, etc.: 15 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: Defect profiling in elemental and multilayer systems: Correlations of fitted defect concentrations with positron implantation profiles
Author/Editor: Ghosh, V. J
Nielsen, B
Lynn, K. G
Welch, D. O
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 15 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : BNL-60588
テクニカルリポート番号 : DE94 015844
テクニカルリポート番号 : CONF-940519-81
Holding library: 国立国会図書館
Call No.: LS-DE94/015844
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005497496
http://id.ndl.go.jp/bib/000005497496
Bibliographic Record Category (NDL): 291