I(sub DDQ) testing for ultimate low power design verification and defect detection SAND-94-1316C DE94 014281 CONF-9410871

I(sub DDQ) testing for ultimate low power design verification and defect detection

SAND-94-1316C DE94 014281 CONF-9410871

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Material Type: 規格・テクニカルリポート類
Title: I(sub DDQ) testing for ultimate low power design verification and defect detection
Author/Editor: Hawkins, C. F
Hewlett, F. W
Soden, J. M
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 3 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-94-1316C
テクニカルリポート番号 : DE94 014281
テクニカルリポート番号 : CONF-9410871
Holding library: 国立国会図書館
Call No.: LS-DE94/014281
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005499260
http://id.ndl.go.jp/bib/000005499260
Bibliographic Record Category (NDL): 291